A few examples
1- EM-Tec TV25 larger variable tilt holder allows 0-90° angle for
sample stubs or sample holders up Ø38mm. Larger stubs can
be mounted, but tilting can be limited, depending on the SEM used.
Compatible with both pin or Hitachi M4 threaded stubs or holders.
Available with pin stub (#12-000248) or M4 thread (#12-000348)
2-
EM-Tec TV12 mini variable tilt mount allows 0-90° angle
in a small sample mount; available with pin stub (#12-000241)
or M4 thread (#12-000347). The sample need to be mounted
on the tilting platform of this compact holder. Side engravings
on the tilting platform assist in setting the desired tilt angle
3- EM-Tec H45 fixed 45° pre-tilt holder for Hitachi M4 stubs/holders,
Ø12.7x17mm, M4 (#12-000341)
4- EM-Tec P38 fixed 36°pre-tilt holder for FEI FIB systems,
Ø12.7x17mm, pin (#12-002238)
The EM-Tec variable tilt and pre-tilt holders are useful for imaging samples under a pre-tilt angle without having to tilt the SEM stage. With these holders you can image previously mounted samples on standard pin stubs or Hitachi stubs at pre-set angles or any chosen angle. The tilt holders are particularly useful for table top SEMs without sample tilting facilities or for standard SEMs where high tilt would interfere with the polepiece or with detectors in the chamber. Sometimes, the pre-tilt holders are used to get full tilting from the SEM stage; with a pre-tilt 45° holder, the SEM stage only needs to be tilted another 45° to get a full 90° sample tilt.
The available EM-Tec tilt holders are:
All the holders are precision machined from vacuum grade aluminium and include set screws and allen key.
For using the pre-tilt and variable tilt holders on JEOL SEMs, you can find the JEOL pin stub and JEOL M4 on the EM-Tec SEM stub adapters page .
Product # |
Style |
Tilt angle |
Dimensions w/o pin |
Stub compatibility |
Stage compatibility |
TV12 |
0-90° |
14x14x14/20mm |
n.a. |
3.2mm pin stub |
|
TV12 |
0-90° |
14x14x14/20mm |
n.a. |
M4 Thread |
|
TV25 |
0-90° |
35x25x10.5/29.5mm |
Pin stub / Hitachi M4 |
3.2mm pin stub |
|
TV25 |
0-90° |
35x25x10.5/29.5mm |
Hitachi M4 / pin stub |
M4 Thread |
|
GS10 |
-90°-0-90° |
28x16x27mm |
n.a. Clamp sample |
3.2mm pin stub |
|
PS15 |
-90°-0-90° |
Ø15x15mm |
n.a. Mount Sample |
3.2mm pin stub |
|
P36 |
36° (Zeiss FIB) |
Ø12.7x17mm |
3.2mm pin stub |
3.2mm pin stub |
|
P38 |
38° (FEI FIB) |
Ø12.7x17mm |
3.2mm pin stub |
3.2mm pin stub |
|
P45 |
45° |
Ø12.7x17mm |
3.2mm pin stub |
3.2mm pin stub |
|
P45M |
45° |
Ø12.7x17mm |
Hitachi M4 thread |
3.2mm pin stub |
|
H45P |
45° |
Ø12.7x17mm |
3.2mm pin stub |
M4 thread |
|
H45 |
45° |
Ø12.7x17mm |
Hitachi M4 thread |
M4 thread |
|
P70 |
70° EBSD |
Ø12.7x20mm |
3.2mm pin stub |
3.2mm pin stub |
|
P70M |
70° EBSD |
Ø12.7x20mm |
Hitachi M4 thread |
3.2mm pin stub |
|
H70P |
70° EBSD |
Ø12.7x20mm |
3.2mm pin stub |
M4 thread |
|
H70 |
70° EBSD |
Ø12.7x20mm |
Hitachi M4 thread |
M4 thread |
Ordering Information for EM-Tec variable tilt and pre-tilt holders for SEMs using pin stubs; TFS, FEI, Philips, Tescan, Phenom, Aspex, RJLee, AmRay, Cambridge Instruments, Leica and CamScan SEMs
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