EM-Tec EDX-Checker for EDX Systems and BSE Detectors
quick and easy calibration & resolution check for EDX systems


#36-000408
EM-Tec EDX-Checker S-8 with C, PTFE, Mn, Al/Cu, Co, AISI316L and 400/1000
mesh Ni grids
#36-000410
EM-Tec EDX-Checker LE-10 with BN, C, PTFE, Mn, Al/Cu, Co,AISI 316L and
400mesh Ni grid

 

Introduction

The EM-Tec EDX-Checker has been developed as a cost-efficient tool for quick and easy checking of calibration, performance, and resolution of an EDX system on an SEM.  Regular use of the EDX-Checker ensures optimum performance of the EDX detector. The EM-Tec EDX-Checker consists of a standard aluminium SEM pin stub with NI grids and the reference materials C, PTFE, Mn, Co, AISI 316L and Al/Cu embedded in a vacuum compatible epoxy. The EDX-Checker stub with the reference materials is polished down to 0.5um and coated with carbon. The additional Boron Nitride is not carbon coated.

The EM-Tec EDX-Checker features:

  • Quick and easy EDX calibration and performance check
  • Ideal for EDX Systems from EDAX, Thermo, Bruker, Oxford Instruments, IXRF, Phenom and JEOL
  • Polished surface – no topography artefacts with the reference materials
  • Available in two versions
  • Known and consistent take-off angle due to polished surface
  • Hexagonal white BN does not need conductive carbon coating
  • Low magnification image and X-ray mapping calibration
  • Compact and cost effective
  • Available as pin stub and with adapters for JEOL and Hitachi SEMs

The EM-Tec EDX-Checker is available in two versions:

  • EDX-Checker S8 with C, PTFE, Mn, Co and Al/Cu as reference materials, AISI 316L for quantitative analysis check and Ni grids with 400 plus 1000 mesh for quick magnification calibration and mapping check. Ideally suited for table top SEMs with EDS.
  • EDX-Checker LE-10 with BN, C, PTFE, Mn, Co and Al/Cu as reference materials, AISI 316L for quantitative analysis check and a 400mesh Nickel grid for quick magnification calibration and mapping check. Optimised for low element performance check.
EDX-Checker with pin stored in tube. EDX-Checker with JEOL Ø25mm adapter. EDX-Checker with Hitachi M4 adapter.

Purpose of the reference materials in the EM-Tec EDX-Checker:

Materials

Purpose of reference material

S-8

LE-10

C

Light element EDX -detector performance test for Carbon

X

X

BN

Light element EDX-Detector performance test for Boron and Nitrogen

 

X

PTFE

Light element test and resolution for Fluorine

X

X

Al/Cu

EDX system calibration with Aluminium and Copper peaks

X

X

Mn

EDX-detector resolution check for Mn Kα Peak

X

X

Co

EDX-detector resolution check and linearity

X

X

AISI 316L

Quantitative analysis check

X

X

400 mesh Ni

Quick magnification check / mapping

X

X

1000 mesh Ni

Quick magnification check / mapping

X

 



Ordering information for the EM-Tec EDX-Checker S-8 with C, PTFE, Mn, Al/Cu, Co, AISI 316L and 400/1000 mesh Ni grids

*Prices without VAT, but within the EU, we have to check for valid VAT-ID.
  
EM-Tec EDX-Checker S-8 with C, PTFE, Mn, Al/Cu, Co, AISI 316L and 400/1000 mesh Ni grids
EM-Tec EDX-Checker S-8 with C, PTFE, Mn, Al/Cu, Co, AISI 316L and 400/1000 mesh Ni grids EDX-Checker S8 with C, PTFE, Mn, Co and Al/Cu as reference materials, AISI 316L for quantitative analysis check and Ni grids with 400 plus 1000 mesh for quick magnification calibration and mapping check.
Product # Unit Price* Add to Quote / Order
36-000408-P EM-Tec EDX-Checker S-8 on Ø12.7 mm standard aluminium pin stub
Qty:

each €300,00
36-000408-J EM-Tec EDX-Checker S-8 with Ø 25 x10mm JEOL adapter for standard aluminium pin stub
Qty:

each €315,00
36-000408-H EM-Tec EDX-Checker S-8 with Hitachi M4 adapter for standard aluminium pin stub
Qty:

each €315,00


Ordering information for the EM-Tec EDX-Checker LE-10 with BN, C, PTFE, Mn, Al/Cu, Co, AISI 316L and 400mesh Ni grid

*Prices without VAT, but within the EU, we have to check for valid VAT-ID.
  
EM-Tec EDX-Checker LE-10 with BN, C, PTFE, Mn, Al/Cu, Co, AISI 316L and 400mesh Ni grid
EM-Tec EDX-Checker LE-10 with BN, C, PTFE, Mn, Al/Cu, Co, AISI 316L and 400mesh Ni grid EDX-Checker LE-10 with BN, C, PTFE, Mn, Co and Al/Cu as reference materials, AISI 316L for quantitative analysis check and a 400mesh Nickel grid for quick magnification calibration and mapping check.
Product # Unit Price* Add to Quote / Order
36-000410-P EM-Tec EDX-Checker LE-10, Ø12.7 mm standard aluminium pin stub
Qty:

each €350,00
36-000410-J EM-Tec EDX-Checker LE-10 with Ø 25 x10mm JEOL adapter for standard aluminium pin stub
Qty:

each €365,00
36-000410-H EM-Tec EDX-Checker LE-10 with Hitachi M4 adapter for standard aluminium pin stub
Qty:

each €365,00




SEM Supplies

TEM Supplies

Calibration

Sample Preparation

AFM / SPM

  Product Menu with Images
  SEM Sample Stubs
  Carbon Tabs
  Sample Stub Adapters
  SEM Stage Adapters
  SEM Sample Holders
  SEM Preparation Stands
  Filaments / Cathodes
  Silicon Finder Grid
  Gatan 3View Pins
  FEI Volumescope Pins
  SEM Stub Storage Boxes
  Phenom Supplies
  JEOL NeoScope Supplies
  Hitachi TM Series Supplies
  Field & Lab Sampler Kits
  FlowView liquid sample Kit

Instruments

  Acoustic Enclosures
  Cressington SEM Coaters
  TEM Sample Prep
  TEM Grids
  TEM Support Films
  Silicon Nitride Films
  K-Kit Wet Cell Holder
  Graphene Films
  TEM Grid Boxes
  Cryo Grid Boxes
  TEM Sample Staining
  3mm Embedding Tubes
  Filaments/Cathodes
  Eyelash Manipulators

Cryo Supplies

  Cryo Grid Boxes
  Other Cryo Supplies

FIB Supplies

  FIB Lift-out Grids
  FIB Low Profile Stubs
  FIB Grid Holders
  FIB Pre-tilt Holders
  FIB Grid Boxes
  SEM / FIB Magn. Calib.
  SEM Res. Test Spec.
  EDS / WDS Calibration
  TEM Calibration
  AFM / SPM Calibration
  LM Magn. Calibration

Vacuum Supplies

  Bullseye Vacuum Gauges
  Quick-check Gauges
  KF/NW Vacuum Parts
  KF/NW Vacuum Hoses
  Vacuum Oil and Grease
  Vacuum Sealant
  Diaphragm Pump
  Vacuum Sample Storage

Sample Coating Supplies

  Sputter Targets
  Carbon Rods & Fibers
  Quartz QCM Crystals
  SEM Sample Coating Fluid

Evaporation Supplies

  Thermal Evaporation Sources
  Evaporation Materials
  Supports & Substrates
  SEM Preparation Stands
  Tweezers
  Probes & Picks
  Applicators & Swabs
  Plastic Transfer Pipettes
  Cutting Tools / Scissors
  Conductive Paint/Cement
  Conductive Tapes & Tabs
  Non-Conductive Adhesives
  Sample Storage
  Hand Tools
  St. St. Woven Wire Mesh
  Preparation Surfaces
  Cleaning / Gloves
  Conductive Metal Powders
  Metallographic Sample Prep
  AFM/SPM Discs
  AFM/SPM Disc Pick-up Tool
  AFM/SPM Holders
  AFM/SPM Disc Storage
  Cantilever Tweezers
  AFM/SPM Discs Tweezers
  Nano-Tec Mica Discs
  HOPG Substrates

Light Microscopy

  Correlative Cover Slips
  Glass Microscope Slides
  Glass Cover Slips
  Quartz Microscope Slides
  Quartz Cover Slips
  Black Metal Slides
  Slide Storage Boxes
  LM Calibration
  Plastic Transfer Pipettes
  Optical Lens Tissue
  Glass Petri Dishes
  PTFE Beakers