EM-Tec EDX-Checker for EDX Systems and BSE Detectors
EM-Tec MCS magnification calibration standards EM-Tec SEM stub adapters
EM-Tec EDX-Checker for EDX Systems and BSE Detectors
quick and easy calibration & resolution check for EDX systems
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#36-000408 |
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EM-Tec EDX-Checker S-8 with C, PTFE, Mn, Al/Cu, Co, AISI316L and 400/1000 mesh Ni grids |
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| #36-000410 |
| EM-Tec EDX-Checker LE-10 with BN, C, PTFE, Mn, Al/Cu, Co,AISI 316L and 400mesh Ni grid |
Introduction
The EM-Tec EDX-Checker has been developed as a cost-efficient tool for quick and easy checking of calibration, performance, and resolution of an EDX system on an SEM. Regular use of the EDX-Checker ensures optimum performance of the EDX detector. The EM-Tec EDX-Checker consists of a standard aluminium SEM pin stub with Nickel TEM grids and the selection of reference materials Bn, C, PTFE, Mn, Co, Al/Cu and AISI 316L embedded in a vacuum compatible epoxy. The EDX-Checker stub with the reference materials is polished down to 0.5um and coated with carbon. The additional Boron Nitride is not carbon coated:
- Quick and easy EDX calibration and performance check
- Ideal for EDX Systems from EDAX, Thermo, Bruker, Oxford Instruments, IXRF, Phenom and JEOL
- Polished surface – no topography artefacts with the reference materials
- Available in two versions
- Known and consistent take-off angle due to polished surface
- Hexagonal white BN does not need conductive carbon coating
- Low magnification image and X-ray mapping calibration
- Compact and cost effective
- Available as pin stub and with adapters for JEOL and Hitachi SEMs
The EM-Tec EDX-Checker is available in 3 versions:
- EDX-Checker S-7 with C, PTFE, Mn, Co and Al/Cu as reference materials and Ni grids with 400 plus 1000 mesh for quick magnification calibration and mapping check. Ideally suited for table top SEMs with EDS.
- EDX-Checker S-8 with C, PTFE, Mn, Co and Al/Cu as reference materials, AISI 316L for quantitative analysis check and Ni grids with 400 plus 1000 mesh for quick magnification calibration and mapping check. Ideally suited for SEMs and table top SEMs with EDS.
- EDX-Checker LE-10 with BN, C, PTFE, Mn, Co and Al/Cu as reference materials, AISI 316L for quantitative analysis check and a 400mesh Nickel grid for quick magnification calibration and mapping check. Optimised for low element performance check.
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| EDX-Checker with pin stored in tube. | EDX-Checker with JEOL Ø25mm adapter. | EDX-Checker with Hitachi M4 adapter. |
Purpose of the reference materials in the EM-Tec EDX-Checker:
Materials |
Purpose of reference material |
S-7 |
S-8 |
LE-10 |
C |
Light element EDX -detector performance test for Carbon |
X |
X |
X |
BN |
Light element EDX-Detector performance test for Boron and Nitrogen |
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X |
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PTFE |
Light element test and resolution for Fluorine |
X |
X |
X |
Al/Cu |
EDX system calibration with Aluminium and Copper peaks |
X |
X |
X |
Mn |
EDX-detector resolution check for Mn Kα Peak |
X |
X |
X |
Co |
EDX-detector resolution check and linearity |
X |
X |
X |
AISI 316L |
Quantitative analysis check |
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X |
X |
400 mesh Ni |
Quick magnification check / mapping |
X |
X |
X |
1000 mesh Ni |
Quick magnification check / mapping |
X |
X |
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| EM-Tec EDX-Checker S-7 | EM-Tec EDX-Checker S-8, with 316L | EM-Tec EDX-Checker LE-10, with light elements |
Ordering information for the EM-Tec EDX-Checker S-7 with C, PTFE, Mn, Al/Cu, Co and 400/1000 mesh Ni grids
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Ordering information for the EM-Tec EDX-Checker S-8 with C, PTFE, Mn, Al/Cu, Co, AISI 316L and 400/1000 mesh Ni grids
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Ordering information for the EM-Tec EDX-Checker LE-10 with BN, C, PTFE, Mn, Al/Cu, Co, AISI 316L and 400mesh Ni grid
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