EM-Tec FIB pre-tilt stub holders
EM-Tec Versa-Plate adaptable SEM sample holders
EM-Tec round multi pin stub holders
EM-Tec SEM stage adapters
EM-Tec round multi pin stub holders
EM-Tec SEM stage adapters
EM-Tec FIB pre-tilt stub holders
Introduction
Example
Pre-tilt stub holders are useful for FIB/SEM systems to get the sample perpendicular with the FIB column to allow for straight FIB milling in to the surface of the sample. The pre-tilt angles are complementary to the angles between the FIB column and the electron beam column. When pre-tilt stub holders are used, there is no need to tilt the sample stage. Three types are available:
- EM-Tec P38 fixed 38° tilt holder for FEI pin stubs. Used to pre-tilt samples 38° for TFS / FEI DualBeam FIB/SEM systems. Size w.o. pin is Ø12.7x17mm.
- EM-Tec P36 fixed angle 36° tilt holder for Zeiss pin stubs. Used to pre-tilt samples 36° for Zeiss CrossBeam FIB/SEM systems. Size w.o. pin is Ø12.7x17mm
- EM-Tec P35 fixed angle 35° tilt holder for standard and Tescan pin stubs. Used to pre-tilt samples 35° for Tescan FIBxSEM systems. Size w.o. pin is Ø12.7x17mm.
Specifications of the EM-Tec pre-til stub holders
Product # |
Style |
Angle |
FIB/SEM |
Capacity |
Size w/o pin |
Stub holding method |
10-002238 |
P38 |
38° |
TFS / FEI |
Ø3.2mm pin |
Ø12.7x17mm |
Set screw |
10-002236 |
P36 |
36° |
Zeiss |
Ø3.2mm pin |
Ø12.7x17mm |
Set screw |
10-002235 |
P35 |
35° |
Tescan |
Ø3.2mm pin |
Ø12.7x17mm |
Set screw |
Ordering information for EM-Tec FIB/SEM pre-tilt stub holders
*Prices without VAT, but within the EU, we have to check for valid VAT-ID.
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